Data retention characteristics under various precycling stress at 150 C... | Download Scientific Diagram
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Endurance and Data Retention Characterization of Infineon Flash Memory
ANAYLYSIS OF MECHANISM ABOUT DATA RETENTION CHARACTERISTIC IN TANOS STRUCTURE
Electronics | Free Full-Text | Read Reference Calibration and Tracking for Non-Volatile Flash Memories
Test Conditions Plastic encapsulated devices are tested at a maximum bake temperature of 150C, 2,000 hours for Data Retention Bake testing. Moisture. - ppt download
Investigation of data retention window closure on logic embedded non-volatile memory
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Endurance and Data Retention Characterization of Infineon Flash Memory
PDF) Mechanisms of retention loss in Ge<inf>2</inf>Sb<inf>2</inf>Te<inf>5</inf>-based Phase-Change Memory | E. Joseph - Academia.edu
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Data retention behavior of a SONOS type two-bit storage flash memory cell | Semantic Scholar
PDF) Data retention failure in NOR flash memory cells
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Figure 1 from RTN impact on data-retention failure/recovery in scaled (∼1Ynm) TLC NAND flash memories | Semantic Scholar
Post-cycling data retention failure in multilevel nor flash memory with nitrided tunnel-oxide | Semantic Scholar
Endurance and Data Retention Characterization of Infineon Flash Memory
Figure 2 from Plasma charging and mobile ions on the data retention of 0.25 /spl mu/m flash memory | Semantic Scholar
Micromachines | Free Full-Text | Physical and Electrical Analysis of Poly-Si Channel Effect on SONOS Flash Memory
Endurance and Data Retention Characterization of Infineon Flash Memory
Purpose Data Retention Bake tests are performed to ensure the
Figure 5 from RTN impact on data-retention failure/recovery in scaled (∼1Ynm) TLC NAND flash memories | Semantic Scholar
ANAYLYSIS OF MECHANISM ABOUT DATA RETENTION CHARACTERISTIC IN TANOS STRUCTURE
